{"id":420,"date":"2017-04-11T08:42:15","date_gmt":"2017-04-11T08:42:15","guid":{"rendered":"http:\/\/fmipa-baru.unj.ac.id\/fisika\/?p=420"},"modified":"2017-04-11T08:42:15","modified_gmt":"2017-04-11T08:42:15","slug":"pelatihan-sem-scanning-electron-microscope-2017","status":"publish","type":"post","link":"https:\/\/fmipa.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/","title":{"rendered":"PELATIHAN SEM (Scanning Electron Microscope) 2017"},"content":{"rendered":"<p>Pelaksanaan: Gedung C Lab FMIPA Lt 2, 6-7 April 2017<\/p>\n<p><em>Scanning Electron Microscope<\/em> (SEM) digunakan untuk mengamati struktur permukaan sampel. Kolom terdiri dari penembak elektron yang menghasilkan arus elektron. Arus melewati lubang dan sistem lensa elektronik yang mengontrol aliran elektron. Arus elektron kemudian melewati kumparan pindai yang me-<em>raster<\/em> berkas di atas sampel. Elektron sekunder dipancarkan dari sampel dan kemudian dikumpulkan oleh detektor elektron sekunder. Sinyal elektron sekunder ditangkap secara digital, diproses dan dibawa melalui konektor USB ke PC untuk ditampilkan. Perangkat lunak PC juga mengontrol pengaturan kolom. Pengaturan kolom adalah pembesaran, tegangan tinggi, lensa kondensor, vakum dan pengaturan mikroskop lainnya.<\/p>\n<p>Mikroskop dirancang dengan mudah berdasarkan intuisi untuk menggunakan perangkat lunak antarmuka. Operasi otomatis dan manual benar-benar berbasis perangkat lunak. Satu-satunya penyesuaian manual adalah mengubah dan menyelaraskan filamen. Juga membersihkan kolom dan mengganti lubang.<\/p>\n<p>Mini-SEM 4500M memiliki 5 sumbu manual yang dikendalikan oleh lima tombol-tombol di pintu.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Pelaksanaan: Gedung C Lab FMIPA Lt 2, 6-7 April 2017 Scanning Electron Microscope (SEM) digunakan untuk mengamati struktur permukaan sampel. Kolom terdiri dari penembak elektron yang menghasilkan arus elektron. Arus melewati lubang dan sistem lensa elektronik yang mengontrol aliran elektron. Arus elektron kemudian melewati kumparan pindai yang me-raster berkas di atas sampel. Elektron sekunder dipancarkan [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[12,14],"tags":[],"class_list":["post-420","post","type-post","status-publish","format-standard","hentry","category-berita","category-prodi-fisika-2"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v28.7 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>PELATIHAN SEM (Scanning Electron Microscope) 2017 - Program Studi Fisika UNJ<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/\" \/>\n<meta property=\"og:locale\" content=\"id_ID\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"PELATIHAN SEM (Scanning Electron Microscope) 2017 - Program Studi Fisika UNJ\" \/>\n<meta property=\"og:description\" content=\"Pelaksanaan: Gedung C Lab FMIPA Lt 2, 6-7 April 2017 Scanning Electron Microscope (SEM) digunakan untuk mengamati struktur permukaan sampel. Kolom terdiri dari penembak elektron yang menghasilkan arus elektron. Arus melewati lubang dan sistem lensa elektronik yang mengontrol aliran elektron. Arus elektron kemudian melewati kumparan pindai yang me-raster berkas di atas sampel. 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Fisika\"],\"inLanguage\":\"id\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/pelatihan-sem-scanning-electron-microscope-2017\\\/\",\"url\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/pelatihan-sem-scanning-electron-microscope-2017\\\/\",\"name\":\"PELATIHAN SEM (Scanning Electron Microscope) 2017 - Program Studi Fisika UNJ\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/#website\"},\"datePublished\":\"2017-04-11T08:42:15+00:00\",\"author\":{\"@id\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/#\\\/schema\\\/person\\\/8df24ef4ecdef7146e64b9d42d5070fb\"},\"breadcrumb\":{\"@id\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/pelatihan-sem-scanning-electron-microscope-2017\\\/#breadcrumb\"},\"inLanguage\":\"id\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/pelatihan-sem-scanning-electron-microscope-2017\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/pelatihan-sem-scanning-electron-microscope-2017\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"PELATIHAN SEM (Scanning Electron Microscope) 2017\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/#website\",\"url\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/\",\"name\":\"Program Studi Fisika UNJ\",\"description\":\"Building Future Scientists\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"id\"},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/fmipa-baru.unj.ac.id\\\/fisika\\\/#\\\/schema\\\/person\\\/8df24ef4ecdef7146e64b9d42d5070fb\",\"name\":\"Fisika\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"id\",\"@id\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/b07850ff0f673500ece311bb99caad53b28d05bf49cfb1c714adcdb8cf31a70c?s=96&d=mm&r=g\",\"url\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/b07850ff0f673500ece311bb99caad53b28d05bf49cfb1c714adcdb8cf31a70c?s=96&d=mm&r=g\",\"contentUrl\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/b07850ff0f673500ece311bb99caad53b28d05bf49cfb1c714adcdb8cf31a70c?s=96&d=mm&r=g\",\"caption\":\"Fisika\"},\"url\":\"https:\\\/\\\/fmipa.unj.ac.id\\\/fisika\\\/author\\\/fisika\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"PELATIHAN SEM (Scanning Electron Microscope) 2017 - Program Studi Fisika UNJ","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/","og_locale":"id_ID","og_type":"article","og_title":"PELATIHAN SEM (Scanning Electron Microscope) 2017 - Program Studi Fisika UNJ","og_description":"Pelaksanaan: Gedung C Lab FMIPA Lt 2, 6-7 April 2017 Scanning Electron Microscope (SEM) digunakan untuk mengamati struktur permukaan sampel. Kolom terdiri dari penembak elektron yang menghasilkan arus elektron. Arus melewati lubang dan sistem lensa elektronik yang mengontrol aliran elektron. Arus elektron kemudian melewati kumparan pindai yang me-raster berkas di atas sampel. Elektron sekunder dipancarkan [&hellip;]","og_url":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/","og_site_name":"Program Studi Fisika UNJ","article_published_time":"2017-04-11T08:42:15+00:00","author":"Fisika","twitter_card":"summary_large_image","twitter_misc":{"Ditulis oleh":"Fisika","Estimasi waktu membaca":"1 menit"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/#article","isPartOf":{"@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/"},"author":{"name":"Fisika","@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/#\/schema\/person\/8df24ef4ecdef7146e64b9d42d5070fb"},"headline":"PELATIHAN SEM (Scanning Electron Microscope) 2017","datePublished":"2017-04-11T08:42:15+00:00","mainEntityOfPage":{"@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/"},"wordCount":148,"articleSection":["Berita","Prodi. Fisika"],"inLanguage":"id"},{"@type":"WebPage","@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/","url":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/","name":"PELATIHAN SEM (Scanning Electron Microscope) 2017 - Program Studi Fisika UNJ","isPartOf":{"@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/#website"},"datePublished":"2017-04-11T08:42:15+00:00","author":{"@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/#\/schema\/person\/8df24ef4ecdef7146e64b9d42d5070fb"},"breadcrumb":{"@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/#breadcrumb"},"inLanguage":"id","potentialAction":[{"@type":"ReadAction","target":["https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/pelatihan-sem-scanning-electron-microscope-2017\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/"},{"@type":"ListItem","position":2,"name":"PELATIHAN SEM (Scanning Electron Microscope) 2017"}]},{"@type":"WebSite","@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/#website","url":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/","name":"Program Studi Fisika UNJ","description":"Building Future Scientists","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"id"},{"@type":"Person","@id":"https:\/\/fmipa-baru.unj.ac.id\/fisika\/#\/schema\/person\/8df24ef4ecdef7146e64b9d42d5070fb","name":"Fisika","image":{"@type":"ImageObject","inLanguage":"id","@id":"https:\/\/secure.gravatar.com\/avatar\/b07850ff0f673500ece311bb99caad53b28d05bf49cfb1c714adcdb8cf31a70c?s=96&d=mm&r=g","url":"https:\/\/secure.gravatar.com\/avatar\/b07850ff0f673500ece311bb99caad53b28d05bf49cfb1c714adcdb8cf31a70c?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/b07850ff0f673500ece311bb99caad53b28d05bf49cfb1c714adcdb8cf31a70c?s=96&d=mm&r=g","caption":"Fisika"},"url":"https:\/\/fmipa.unj.ac.id\/fisika\/author\/fisika\/"}]}},"_links":{"self":[{"href":"https:\/\/fmipa.unj.ac.id\/fisika\/wp-json\/wp\/v2\/posts\/420","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/fmipa.unj.ac.id\/fisika\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/fmipa.unj.ac.id\/fisika\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/fmipa.unj.ac.id\/fisika\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/fmipa.unj.ac.id\/fisika\/wp-json\/wp\/v2\/comments?post=420"}],"version-history":[{"count":0,"href":"https:\/\/fmipa.unj.ac.id\/fisika\/wp-json\/wp\/v2\/posts\/420\/revisions"}],"wp:attachment":[{"href":"https:\/\/fmipa.unj.ac.id\/fisika\/wp-json\/wp\/v2\/media?parent=420"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/fmipa.unj.ac.id\/fisika\/wp-json\/wp\/v2\/categories?post=420"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/fmipa.unj.ac.id\/fisika\/wp-json\/wp\/v2\/tags?post=420"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}