SEM (Scanning Electron Microscope) Training 2017

SEM (Scanning Electron Microscope) Training 2017

Place: Building C Lab FMIPA Floor 2

Date: 6-7 April 2017

Scanning Electron Microscope (SEM) is used to observe the surface structure of the sample. The column consists of an electron gun, which generates a stream of electrons. The current passes through the holes and a system of electronic lenses that control the flow of electrons. The electron stream then passes through a scan coil, which rasters the beam over the sample. Secondary electrons are emitted from the sample and then collected by the secondary electron detector. The secondary electron signal is digitally captured, processed, and carried to a PC for display via the USB connector. The PC software also controls column settings. Column settings are magnification, high voltage, condenser lens, vacuum, and other microscope settings.

The microscope is designed with an intuitive-to-use interface software. Automatic and manual operations are completely software-based. The only manual adjustments are changing and aligning the filament. Also cleaned the columns and replaced the holes.

The Mini-SEM 4500M has five manual axes controlled by five knobs on the door.